參考文獻 |
[1] J. Weimer, K. Baade. J. Fitzsimmons, B. Lowe, “A Rapid Dither Algorithm Advances A/D Converter Testing”, IEEE International Test Conference 1990, pp.498-507
[2] S. Max, “Fast, Accurate and Complete ADC Testing”, International Test Conference 1989, pp. 111-117.
[3] R. Martins, A. M., C. Serra, “Automated ADC Characterization Using the Histogram Test Stimulated by Gaussian Noise”, IEEE Transactions on Instrument and Measurement, VOL.48, NO.2, pp. 471-474.
[4] R. Martins, A. M. C. Serra , “The Use of a Noise Stimulus in ADC characterization”, Electronics, Circuits and Systems, 1998 IEEE International Conference on Volume: 3 , 1998 , Page(s): 457 -460 vol.3
[5] F. Azais, S. Bernard, Y. Bertrand, M. Renovell ,“Toward an ADC BIST Scheme Using the Histogram Test Technique”, European Test Workshop, 2000. Proceedings. IEEE , 2000 , Page(s): 53 —58.
[6] P. Carbone, D. Petri , “Noise Sensitivity of the ADC Histogram Test”, Instrumentation and Measurement, IEEE Transactions on Volume: 474 , Aug. 1998 , Page(s): 1001 —1004.
[7] IEEE Std 1057-1994, IEEE standard for digitizing waveform recorders, 30 Dec. 1994.
[8] Larrabee, J.H.; Hummels, D.M.; Irons, F.H.,” ADC compensation using a sinewave histogram method”, Instrumentation and Measurement Technology Conference,1997.IMTC/97.Proceedings,Sensing,Processing,Networking.,Vol.1,pp628-631,1997
[9] Ben-Hamida N., Ayari, B., Kaminska B., “Testing of Embedded A/D Converters in Mixed-Signal Circuit” , Computer Design: VLSI in Computers and Processors, 1996. ICCD '96. Proceedings., 1996 IEEE International Conference on , 1996 , Page(s): 135 —136.
[10] Zagursky, V.; Gertners, A., “Testing technique for embedded ADC”, Circuits and Systems, 1998. IEEE APCCAS 1998. The 1998 IEEE Asia-Pacific Conference on , 1998 , Page(s): 775 —778
[11] Mielke, J.A. ,“Frequency domain testing of ADCs”, IEEE Design & Test of Computers,Vol.13,pp64-69,1996
[12] Bellan D., Brandolini A., Gandelli A., “ADC nonlinearity and harmonic distortion in FFT Test”, Instrumentation and Measurement Technology Conference, 1998. IMTC/98. Conference Proceedings. IEEE Volume: 2 , 1998 , Page(s): 1233 -1238 vol.2
[13] Benetazzo L., Narduzzi C., Offelli C., Petri D., “A/D converter performance analysis by a frequency domain approach”, Instrumentation and Measurement Technology Conference, 1992. IMTC '92., 9th IEEE , 1992 , Page(s): 285 —289
[14] Hagelauer R., Oehler F., Rohmer G., Sauerer J., Seitzer D., Schmitt R., Winkler D., “Investigations and measurements of the dynamic performance of high-speed ADCs”, Instrumentation and Measurement, IEEE Transactions on Volume: 416 , Dec. 1992 , Page(s): 829 -833
[15] Arabi, K.; Kaminska, I.; Rzeszut, J., “BIST for D/A and A/D converters”, IEEE Design & Test of Computers, Volume: 13 Issue: 4 , Winter 1996 , Page(s): 40 —49
[16] Arabi, K.; Kaminska, I.; Rzeszut, J., “A built-in self-test approach for medium to high-resolution digital-to-analog converters”, Test Symposium, 1994., Proceedings of the Third Asian , 1994 , Page(s): 373 —378
[17] Hassan, I.H.S.; Arabi, K.; Kaminska, B., “Testing digital to analog converters based on oscillation-test strategy using sigma-delta modulation”, Computer Design: VLSI in Computers and Processors, 1998. ICCD '98. Proceedings. International Conference on, 1998 , Page(s): 40 -46
[18] Yun-Che Wen; Kuen-Jong Lee, “BIST structure for DAC testing”, Electronics Letters , Volume: 34 Issue: 12 , 11 June 1998 , Page(s): 1173 —1174
[19] Fasang, P.P., “An optimal method for testing digital to analog converters”, ASIC Conference and Exhibit, 1997. Proceedings., Tenth Annual IEEE International , 1997
Page(s): 42 —46
[20] Fang Xu, “A new approach for the nonlinearity test of ADCs/DACs and its application for BIST”, Test Workshop 1999. Proceedings. European , 1999
Page(s): 34 —38
[21] Arabi, K.; Kaminska, I.; Rzeszut, J., “A New Built-in Self-test Approach For Digital-to-analog And Analog-to-digital Converters”, Computer-Aided Design, 1994., IEEE/ACM International Conference on Page(s): 491 -494
[22] Chin-Long Wey ,“Mixed-signal circuit testing-A review”, Proceedings of the Third IEEE International Conference,Vol.2,pp. 1064 —1067, 1996
[23] Mir, S.; Lubaszewski, M.; Liberali, V.; Courtois, B.,” Built-in self-test approaches for analogue and mixed-signal integrated circuits”, Circuits and Systems, 1995.,Proceedings.,Proceedings of the 38th Midwest Symposium, Vol.2, pp1145 —1150,1996 |